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Advanced Combinatorial Testing Techniques

Aut. 30, 2009

Dr. Jeff Lei (PI) has received an award from NIST for his proposal entitled, “Advanced Combinatorial Testing Techniques”, with a total amount of $248K.

Combinatorial testing is a specification-based software testing approach that systematically samples the input space of a software application to satisfy a well-defined combinatorial coverage criterion. Combinatorial testing is founded on the theory of covering arrays, and has been shown very effective in fault detection for practical applications. This project will develop advanced combinatorial testing techniques in several areas, including combinatorial sequence generation, combinatorial fault localization, constrained combinatorial testing, and combinatorial security testing. These techniques will be integrated and disseminated in a combinatorial testing tool, called ACTS, that currently has a user base of more than 200 academic and corporate users.